OPTİK ANALİZÖRLERİ

The AQ2200-222 is a high-performance yet compact module equipped with two sensors. The module offers high-speed sampling, low polarization dependency, and rich data processing capabilities for improved measurement throughput and low-cost multi-port measurement. With two high-performance sensors in one slot, this Optical Power Meter Sensor Module is ideal for space-saving, multi-port measurements.
JAPON MALI

The AQ2200-112 is a light source module with high output level stability performance, it is suitable for testing the performance of passive optical components as well as calibration of optical power meters.
JAPON MALI

The AQ6151B Optical Wavelength Meter is an ideal instrument for accurately measuring the optical wavelength of optical devices and systems with wavelength ranges from 900 nm to 1700 nm. By employing a Michelson interferometer and a high speed Fast Fourier Transform (FFT) algorithm, the AQ6151B can measure not only a single wavelength laser signal, but also a multiple wavelength laser signal from a DWDM system and Fabry-Perot laser. Furthermore, this technology enables the measurement of modulated laser signals in addition to the CW signal from an optical transceiver. The optimized optical design and data processing routine significantly reduces the measurement time and improves manufacturing throughput.

• High wavelength accuracy: ±0.2 ppm
• Wavelength range (3 types): 900-1700nm, 1200-1700nm, 1270-1650nm
• Measurement time of 0.2 seconds or less
• Up to 1024 wavelengths can be measured at once
• Single wavelength type and multi wavelength type
• Support modulated light and filter measurement

JAPON MALI

The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.
JAPON MALI